Characterization of a nanopipe dislocation in GaN by means of HR-EBSD and field dislocation mechanics analysis
Clément Ernould, Vincent Taupin, Benoît Beausir, J.J. Fundenberger, Nabila Maloufi, Julien Guyon, Emmanuel Bouzy
Topics & Concepts
DislocationBurgers vectorMaterials scienceElectron backscatter diffractionCharacterization (materials science)Peierls stressCondensed matter physicsDiffractionStress fieldRotation (mathematics)Shear stressOpticsDislocation creepPhysicsGeometryComposite materialNanotechnologyMathematicsThermodynamicsFinite element methodMetal and Thin Film MechanicsNanowire Synthesis and ApplicationsGaN-based semiconductor devices and materials