Few-shot unseen defect segmentation for polycrystalline silicon panels with an interpretable dual subspace attention variational learning framework
Haiming Yao, Wei Luo, Wenyong Yu, Xiaotian Zhang, Zhenfeng Qiang, Donghao Luo, Hui Shi
Topics & Concepts
Subspace topologyDual (grammatical number)Artificial intelligenceShot (pellet)SegmentationOne shotComputer sciencePattern recognition (psychology)Computer visionMaterials scienceEngineeringMechanical engineeringArtMetallurgyLiteratureIndustrial Vision Systems and Defect Detection3D Surveying and Cultural HeritageOptical measurement and interference techniques