The structural, mechanical and electrical properties of 2D SiC with C-related point defects and substitution of C by foreign atoms
Lingqin Huang, Haoyu Liu, Xuliang Deng, Wenwen Cui
Topics & Concepts
Materials scienceBand gapSemiconductorVacancy defectImpurityCondensed matter physicsCharge carrierDirect and indirect band gapsCrystallographic defectWide-bandgap semiconductorPhononCrystallographyOptoelectronicsChemistryOrganic chemistryPhysicsGraphene research and applicationsMXene and MAX Phase Materials2D Materials and Applications