A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function
Guangze Pan, Yaqiu Li, Xiaobing Li, Qin Luo, Chunhui Wang, Xianghong Hu
Topics & Concepts
Reliability engineeringCopula (linguistics)RandomnessWiener processReliability (semiconductor)Degradation (telecommunications)Computer scienceEvaluation methodsEngineeringMathematicsStatisticsEconometricsPhysicsTelecommunicationsQuantum mechanicsPower (physics)Reliability and Maintenance OptimizationPower System Reliability and MaintenanceProbabilistic and Robust Engineering Design