Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures
Ömer Sevgi̇li̇, Yashar Azizian‐Kalandaragh, Ş. Altındal
Topics & Concepts
Materials scienceCapacitanceDielectricDepletion regionDielectric spectroscopySemiconductorLow frequencyAnalytical Chemistry (journal)Electrical impedanceFerrite (magnet)MetalVoltageCondensed matter physicsOptoelectronicsComposite materialElectrodeElectrochemistryPhysicsChemistryMetallurgyChromatographyAstronomyQuantum mechanicsSemiconductor materials and interfacesSemiconductor materials and devicesDielectric properties of ceramics