A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials
Nitul S. Rajput, Karen Sloyan, Dalaver H. Anjum, Matteo Chiesa, Amal Al Ghaferi
Topics & Concepts
Materials scienceThin filmNanotechnologyGrapheneSample preparationSubstrate (aquarium)Transmission electron microscopyComputer scienceChemistryGeologyOceanographyChromatographySurface and Thin Film PhenomenaElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and Applications