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Validity of power cycling lifetime models for modules and extension to low temperature swings

Josef Lutz, Christian Schwabe, Guang Zeng, Lukas Hein

202025 citationsDOI

Abstract

Various papers in power electronics contain a part of lifetime estimation depending on power cycles in application. The used model is often the CIPS08 lifetime model published at the conference CIPS 2008. In many applications, a lot of cycles with low temperature swings occur. The used model, however, is only valid for temperature swings above 40 K. For temperature swings <; 30 K, there are strong deviations, since some materials are now approaching the elastic region. First experimental power cycling results are gained below 30 K temperature swing. Also an approximation for the reliability of low temperature swing is given in this paper.

Topics & Concepts

SwingPower cyclingReliability (semiconductor)Power (physics)CyclingTemperature cyclingTemperature measurementExtension (predicate logic)Power electronicsJunction temperatureElectrical engineeringComputer scienceAutomotive engineeringReliability engineeringEngineeringVoltageMechanical engineeringThermodynamicsPhysicsThermalArchaeologyHistoryProgramming languageSilicon Carbide Semiconductor TechnologiesElectronic Packaging and Soldering TechnologiesAdvanced Battery Technologies Research
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