Analysis on electrical parameters including temperature and interface trap charges in gate overlap Ge source step shape double gate TFET
Rajesh Saha, Rupam Goswami, Deepak Kumar Panda
Topics & Concepts
Materials scienceLinearityQuantum tunnellingIonOptoelectronicsTrap (plumbing)Degradation (telecommunications)Analytical Chemistry (journal)ChemistryElectrical engineeringPhysicsEngineeringOrganic chemistryChromatographyMeteorologyAdvancements in Semiconductor Devices and Circuit DesignSemiconductor materials and devicesNanowire Synthesis and Applications