Reliability of high-speed electric multiple units in terms of the expanded multi-state flow network
Shuai Lin, Limin Jia, Hengrun Zhang, Pengzhu Zhang
Topics & Concepts
Reliability (semiconductor)Computer scienceFlow networkRealization (probability)State (computer science)Reliability engineeringFunction (biology)Layer (electronics)MathematicsEngineeringMathematical optimizationAlgorithmStatisticsPower (physics)BiologyChemistryPhysicsQuantum mechanicsOrganic chemistryEvolutionary biologyReliability and Maintenance OptimizationPower System Reliability and MaintenanceRisk and Safety Analysis