Properties of the structural defects during SiC–crystal–induced crystallization on the solid–liquid interface
Yue Gao, Wanjun Yan, Tinghong Gao, Qian Chen, Wensheng Yang, Quan Xie, Zean Tian, Yongchao Liang, Jun Luo, Lianxin Li
Topics & Concepts
Materials scienceCrystallizationCrystal (programming language)CrystallographyVacancy defectChemical physicsCrystal growthCrystallographic defectSemiconductorCondensed matter physicsMolecular physicsOptoelectronicsChemical engineeringPhysicsComputer scienceEngineeringProgramming languageChemistrySilicon Carbide Semiconductor TechnologiesSilicon and Solar Cell TechnologiesThin-Film Transistor Technologies