Litcius/Paper detail

A review of doped metal oxide semiconductors in the stability of thin film transistors

Zhihao Liang, Weijin Wu, Zhiqiang Fang, Zeneng Deng, Xiao Fu, Honglong Ning, Dongxiang Luo, Zhennan Zhu, Rihui Yao, Junbiao Peng

2024Journal of Alloys and Compounds14 citationsDOI

Topics & Concepts

Materials scienceDopingSemiconductorThin filmThin-film transistorOptoelectronicsOxideNanotechnologyMetalEngineering physicsMetallurgyPhysicsLayer (electronics)Thin-Film Transistor TechnologiesTransition Metal Oxide NanomaterialsCCD and CMOS Imaging Sensors