Defect detection of MicroLED with low distinction based on deep learning
Meiyun Chen, Jinbiao Chen, Cheng Li, Qianxue Wang, Kiyoshi Takamasu
Topics & Concepts
Computer scienceFuse (electrical)Artificial intelligencePyramid (geometry)Convolutional neural networkFeature (linguistics)Pattern recognition (psychology)Deep learningReliability (semiconductor)ResidualPrecision and recallComputer visionAlgorithmQuantum mechanicsPhilosophyElectrical engineeringPower (physics)OpticsPhysicsLinguisticsEngineeringIndustrial Vision Systems and Defect DetectionInfrared Target Detection MethodologiesAdvanced Neural Network Applications