True Atomic-Resolution Surface Imaging and Manipulation under Ambient Conditions via Conductive Atomic Force Microscopy
Saima A. Sumaiya, Jun Liu, Mehmet Z. Baykara
Abstract
A great number of chemical and mechanical phenomena, ranging from catalysis to friction, are dictated by the atomic-scale structure and properties of material surfaces. Yet, the principal tools utilized to characterize surfaces at the atomic level rely on strict environmental conditions such as ultrahigh vacuum and low temperature. Results obtained under such well-controlled, pristine conditions bear little relevance to the great majority of processes and applications that often occur under ambient conditions. Here, we report true atomic-resolution surface imaging via conductive atomic force microscopy (C-AFM) under ambient conditions, performed at high scanning speeds. Our approach delivers atomic-resolution maps on a variety of material surfaces that comprise defects including single atomic vacancies. We hypothesize that atomic resolution can be enabled by either a confined, electrically conductive pathway or an individual, atomically sharp asperity at the tip–sample contact. Using our method, we report the capability of in situ charge state manipulation of defects on MoS2 and the observation of an exotic electronic effect: room-temperature charge ordering in a thin transition metal carbide (TMC) crystal (i.e., an MXene), α-Mo2C. Our findings demonstrate that C-AFM can be utilized as a powerful tool for atomic-resolution imaging and manipulation of surface structure and electronics under ambient conditions, with wide-ranging applicability.