Towards characterizing adversarial defects of deep learning software from the lens of uncertainty
Xiyue Zhang, Xiaofei Xie, Lei Ma, Xiaoning Du, Qiang Hu, Yang Liu, Jianjun Zhao, Meng Sun
Abstract
Over the past decade, deep learning (DL) has been successfully applied to many industrial domain-specific tasks. However, the current state-of-the-art DL software still suffers from quality issues, which raises great concern especially in the context of safety- and security-critical scenarios. Adversarial examples (AEs) represent a typical and important type of defects needed to be urgently addressed, on which a DL software makes incorrect decisions. Such defects occur through either intentional attack or physical-world noise perceived by input sensors, potentially hindering further industry deployment. The intrinsic uncertainty nature of deep learning decisions can be a fundamental reason for its incorrect behavior. Although some testing, adversarial attack and defense techniques have been recently proposed, it still lacks a systematic study to uncover the relationship between AEs and DL uncertainty.