Texture evolution as a function of scan strategy and build height in electron beam melted Ti-6Al-4V
Alec I. Saville, Sven C. Vogel, Adam Creuziger, Jake T. Benzing, Adam L. Pilchak, Peeyush Nandwana, Jonah Klemm-Toole, Kester D. Clarke, S. L. Semiatin, Amy J. Clarke
Topics & Concepts
Materials scienceElectron backscatter diffractionTexture (cosmology)Equiaxed crystalsMicrostructureFiberRaster scanCrystallographyComposite materialOpticsArtificial intelligenceChemistryImage (mathematics)Computer sciencePhysicsAdditive Manufacturing Materials and ProcessesTitanium Alloys Microstructure and PropertiesHigh Entropy Alloys Studies