In-depth analysis of defects in TiO2 compact electron transport layers and impact on performance and hysteresis of planar perovskite devices at low light
Anthony Lewis, Joel Troughton, Benjamin Smith, James McGettrick, Tom Dunlop, Francesca De Rossi, Adam Pockett, Michael Spence, Matthew J. Carnie, Trystan Watson, Cécile Charbonneau
Topics & Concepts
Perovskite (structure)Materials scienceLayer (electronics)OptoelectronicsHysteresisScanning electron microscopePlanarAnalytical Chemistry (journal)Composite materialChemistryCrystallographyChromatographyPhysicsComputer scienceComputer graphics (images)Quantum mechanicsPerovskite Materials and ApplicationsChalcogenide Semiconductor Thin FilmsConducting polymers and applications