Study of Al2O3 thin films by ALD using H2O and O3 as oxygen source for waveguide applications
Diana Laura Caballero-Espitia, E. Medina, H.A. Borbón-Núñez, O.E. Contreras-López, Hugo Tiznado, H. Márquez
Topics & Concepts
X-ray photoelectron spectroscopyAtomic layer depositionFourier transform infrared spectroscopyEllipsometryRefractive indexMaterials scienceOxygenWaveguideThin filmAnalytical Chemistry (journal)SpectroscopyInfraredOptoelectronicsOpticsChemistryNanotechnologyChemical engineeringPhysicsQuantum mechanicsEngineeringOrganic chemistryChromatographySemiconductor materials and devicesPhotonic and Optical DevicesPhotorefractive and Nonlinear Optics