DAS: Densely-Anchored Sampling for Deep Metric Learning
Lizhao Liu, Shangxin Huang, Zhuangwei Zhuang, Ran Yang, Mingkui Tan, Yaowei Wang
Topics & Concepts
EmbeddingComputer scienceDiscriminative modelBoosting (machine learning)Metric (unit)ExploitArtificial intelligenceBenchmark (surveying)Metric spaceSampling (signal processing)Deep learningPattern recognition (psychology)Computer visionMathematicsOperations managementMathematical analysisGeodesyGeographyFilter (signal processing)Computer securityEconomicsDomain Adaptation and Few-Shot LearningFace recognition and analysisFace and Expression Recognition