Reliability modeling and evaluation of lifetime delayed degradation process with nondestructive testing
Zan Li, Fengming Wang, Chengjie Wang, Qingpei Hu, Dan Yu
Topics & Concepts
Reliability (semiconductor)Degradation (telecommunications)InferenceReliability engineeringStatistical inferenceComputer scienceProcess (computing)Failure mode and effects analysisGamma processMaximizationStatistical hypothesis testingStochastic processAlgorithmNondestructive testingEngineeringMathematical optimizationStatisticsMathematicsArtificial intelligenceTelecommunicationsRadiologyPower (physics)PhysicsQuantum mechanicsOperating systemMedicineReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design