Atom probe analysis of BaTiO3 enabled by metallic shielding
Se‐Ho Kim, Kihyun Shin, Xuyang Zhou, Chanwon Jung, Hyun You Kim, S. Pedrazzini, Michele Conroy, Graeme Henkelman, Baptiste Gault
Topics & Concepts
Atom probeMaterials scienceShielding effectPiezoelectricityMicroanalysisCoatingElectromagnetic shieldingAtom (system on chip)Penetration (warfare)NanotechnologyCeramicMetalChemical physicsComposite materialMetallurgyTransmission electron microscopyEngineeringPhysicsComputer scienceOrganic chemistryEmbedded systemOperations researchChemistryAdvanced Materials Characterization TechniquesElectronic and Structural Properties of OxidesAdvanced materials and composites