Double pattern improves the Schlieren methods for measuring liquid–air interface topography
Jean Metzmacher, Guillaume Lagubeau, Martin Poty, Nicolas Vandewalle
Topics & Concepts
SchlierenOpticsSchlieren photographyParaxial approximationInterface (matter)Container (type theory)Materials scienceComputer sciencePhysicsMechanicsBeam (structure)Flow (mathematics)Flow visualizationBubbleMaximum bubble pressure methodComposite materialElectrowetting and Microfluidic TechnologiesMicrofluidic and Bio-sensing TechnologiesDigital Holography and Microscopy