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New perspectives on twinning events during strain-induced grain boundary migration (SIBM) in iteratively processed 316L stainless steel

Nitin Kumar Sharma, Shashank Shekhar

2020Journal of Materials Science20 citationsDOI

Topics & Concepts

MisorientationMaterials scienceElectron backscatter diffractionGrain boundaryCrystal twinningRecrystallization (geology)MicrostructurePopulationMetallurgyGeologyDemographySociologyPaleontologyMicrostructure and mechanical propertiesMicrostructure and Mechanical Properties of SteelsHigh Temperature Alloys and Creep
New perspectives on twinning events during strain-induced grain boundary migration (SIBM) in iteratively processed 316L stainless steel | Litcius