PCB defect detection with self-supervised learning of local image patches
Naifu Yao, Yongqiang Zhao, Seong G. Kong, Yang Guo
Topics & Concepts
Artificial intelligencePattern recognition (psychology)Feature (linguistics)Computer scienceImage (mathematics)Similarity (geometry)Anomaly detectionComputer visionCluster analysisConsistency (knowledge bases)Feature learningLinguisticsPhilosophyIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisImage Processing Techniques and Applications