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Remaining useful life (RUL) regression using Long–Short Term Memory (LSTM) networks

Sofia Yousuf, Salman A. Khan, Saqib Khursheed

2022Microelectronics Reliability38 citationsDOI

Topics & Concepts

CadenceCMOSTerm (time)RegressionComputer scienceVoltageRecurrent neural networkRing oscillatorEpoch (astronomy)Artificial neural networkLong short term memoryWarning systemRegression analysisArtificial intelligenceReliability engineeringEngineeringElectronic engineeringMachine learningStatisticsMathematicsElectrical engineeringTelecommunicationsPhysicsComputer visionQuantum mechanicsStarsSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Semiconductor Devices and Circuit Design
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