Fast and effective observations of the pore structure of tight sandstones at the same location by utilizing AFM and CF-SEM
Wentong Zhang, Zhengfu Ning, Shaohua Gai, Jie Zhu, Fan Fan, Zongke Liu, Hengli Wang
Topics & Concepts
Microscale chemistryScanning electron microscopeNanoindentationMaterials scienceNanoscopic scaleNanotechnologyCharacterization (materials science)Surface finishSurface roughnessComposite materialMathematicsMathematics educationHydrocarbon exploration and reservoir analysisHydraulic Fracturing and Reservoir AnalysisDrilling and Well Engineering