Is MIP-OES a suitable alternative to ICP-OES for trace element analysis?
Beatriz M. Fontoura, Florencia Cora Jofré, Trey Williams, Marianela Savio, George L. Donati, Joaquim A. Nóbrega
Abstract
New developments in instrumentation, plasma diagnostics, calibration, and sample preparation applied to MIP-OES may make it competitive with ICP-OES.
Topics & Concepts
Inductively coupled plasma atomic emission spectroscopyCalibrationTrace elementAnalytical Chemistry (journal)Inductively coupled plasmaChemistryMaterials sciencePlasmaChromatographyMetallurgyMathematicsPhysicsStatisticsQuantum mechanicsAnalytical chemistry methods developmentNuclear Physics and ApplicationsX-ray Spectroscopy and Fluorescence Analysis