Probe Incompatibility in Multiparameter Noisy Quantum Metrology
Francesco Albarelli, Rafał Demkowicz-Dobrzański
Abstract
Quantum metrology methods are well suited when measuring a single parameter, but more than one remains challenging. A new tool for benchmarking the precision of multiple parameter measurements could help further development.
Topics & Concepts
Quantum metrologyMetrologyBenchmarkingQuantumQuantum sensorComputer scienceQuantum technologyStatistical physicsPhysicsOpticsQuantum mechanicsOpen quantum systemBusinessMarketingQuantum Information and CryptographySpectroscopy and Quantum Chemical StudiesQuantum and electron transport phenomena