MDCA-DETR: DETR with multi-channel deformable convolution and coordinate attention for mini-LED wafer surface defects detection
Yuanda Lin, Shuwan Pan, Jie Yu, Yade Hong, Fuming Wang, Lixin Zheng, Jianeng Tang, Songyan Chen
Topics & Concepts
WaferConvolution (computer science)Channel (broadcasting)Materials scienceComputer scienceSurface (topology)Artificial intelligenceOptoelectronicsTelecommunicationsMathematicsArtificial neural networkGeometryIndustrial Vision Systems and Defect DetectionInfrastructure Maintenance and MonitoringSurface Roughness and Optical Measurements