An artificial neural network supported Wiener process based reliability estimation method considering individual difference and measurement error
Di Liu, Shaoping Wang, Xiaoyu Cui
Topics & Concepts
Artificial neural networkReliability (semiconductor)Process (computing)Wiener processComputer scienceAlgorithmReliability engineeringArtificial intelligenceStatisticsMathematicsEngineeringPower (physics)Operating systemPhysicsQuantum mechanicsReliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsNon-Destructive Testing Techniques