Defects identification using the improved ultrasonic measurement model and support vector machines
Huifang Xiao, Dan Chen, Jinwu Xu, Shifeng Guo
Topics & Concepts
Ultrasonic sensorSupport vector machineAmplitudeAcousticsUltrasonic testingWaveformEcho (communications protocol)Materials sciencePattern recognition (psychology)Artificial intelligenceComputer scienceOpticsPhysicsTelecommunicationsRadarComputer networkNon-Destructive Testing TechniquesUltrasonics and Acoustic Wave PropagationThermography and Photoacoustic Techniques