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Thermally stable, low resistance Mg2Si0.4Sn0.6/Cu thermoelectric contacts using SS 304 interlayer by one step sintering

B. Jayachandran, B. Prasanth, R. Gopalan, Titas Dasgupta, D. Sivaprahasam

2020Materials Research Bulletin25 citationsDOI

Topics & Concepts

Materials scienceSinteringElectrical resistivity and conductivityAnnealing (glass)Contact resistanceFabricationElectrical contactsThermoelectric effectElectrodeComposite materialSeebeck coefficientMetallurgyThermal conductivityElectrical engineeringChemistryLayer (electronics)PathologyEngineeringMedicineAlternative medicinePhysical chemistryPhysicsThermodynamicsAdvanced Thermoelectric Materials and DevicesThermal Expansion and Ionic ConductivitySemiconductor materials and interfaces
Thermally stable, low resistance Mg2Si0.4Sn0.6/Cu thermoelectric contacts using SS 304 interlayer by one step sintering | Litcius