Feature optimization method for the localization technology on loose particles inside sealed electronic equipment
Zhigang Sun, Aiping Jiang, Mengmeng Gao, Min Zhang, Guotao Wang
Topics & Concepts
Normalization (sociology)Computer scienceFeature selectionStandardizationPattern recognition (psychology)Feature (linguistics)Artificial intelligenceStatisticData miningMutual informationMathematicsStatisticsLinguisticsAnthropologyOperating systemSociologyPhilosophyNon-Destructive Testing TechniquesIndustrial Vision Systems and Defect DetectionInfrastructure Maintenance and Monitoring