A similarity based methodology for machine prognostics by using kernel two sample test
Haoshu Cai, Xiaodong Jia, Jianshe Feng, Wenzhe Li, Laura Pahren, Jay Lee
Topics & Concepts
PrognosticsWeibull distributionSimilarity (geometry)Kernel (algebra)Kernel density estimationData miningMatching (statistics)Sample (material)EngineeringReliability (semiconductor)Fuse (electrical)Computer scienceProbabilistic logicArtificial intelligenceReliability engineeringPattern recognition (psychology)StatisticsMathematicsPower (physics)Image (mathematics)PhysicsEstimatorChromatographyElectrical engineeringChemistryCombinatoricsQuantum mechanicsMachine Fault Diagnosis TechniquesReliability and Maintenance OptimizationNon-Destructive Testing Techniques