Deep open-set recognition for silicon wafer production monitoring
Luca Frittoli, Diego Carrera, Beatrice Rossi, Pasqualina Fragneto, Giacomo Boracchi
Topics & Concepts
WaferArtificial intelligenceComputer scienceSet (abstract data type)Open setSiliconProduction (economics)Pattern recognition (psychology)Computer visionMaterials scienceOptoelectronicsMathematicsProgramming languageMacroeconomicsDiscrete mathematicsEconomicsIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Surface Polishing Techniques