XPS analysis and structural characterization of CZTS thin films deposited by one-step thermal evaporation
S. Ahmadi, N. Khémiri, A. Cantarero, M. Kanzari
Topics & Concepts
CZTSKesteriteX-ray photoelectron spectroscopyRaman spectroscopyMaterials scienceCrystallinityCrystalliteEvaporationThin filmAnalytical Chemistry (journal)CalcinationScanning electron microscopeChemical engineeringMineralogyChemistryMetallurgyNanotechnologyComposite materialOpticsThermodynamicsChromatographyCatalysisPhysicsBiochemistryEngineeringChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesZnO doping and properties