Control of deposition height in WAAM using visual inspection of previous and current layers
Jun Xiong, Yiyang Zhang, Yupeng Pi
Topics & Concepts
Process (computing)Layer (electronics)Machine visionPID controllerController (irrigation)Control systemDeposition (geology)Current (fluid)AutomationEngineeringComputer scienceStability (learning theory)Artificial intelligenceControl engineeringMaterials scienceMechanical engineeringElectrical engineeringTemperature controlComposite materialSedimentAgronomyBiologyOperating systemMachine learningPaleontologyAdditive Manufacturing Materials and ProcessesWelding Techniques and Residual StressesIndustrial Vision Systems and Defect Detection