Performance degradation and reliability analysis of a MEMS flow sensor with accelerated degradation testing
Qiaoqiao Kang, Yuzhe Lin, Jifang Tao
Topics & Concepts
Degradation (telecommunications)Reliability (semiconductor)Weibull distributionResidualMicroelectromechanical systemsAccelerated life testingStress (linguistics)Reliability engineeringMaterials scienceStatisticsComputer scienceMathematicsElectronic engineeringEngineeringAlgorithmPower (physics)PhysicsThermodynamicsLinguisticsPhilosophyOptoelectronicsSensor Technology and Measurement SystemsAdvanced Sensor Technologies ResearchScientific Measurement and Uncertainty Evaluation