Current state-of-the-art characterization methods for probing defect passivation towards efficient perovskite solar cells
Duoling Cao, Wenbo Li, Xu Zhang, Li Wan, Zhiguang Guo, Xianbao Wang, Dominik Eder, Shimin Wang
Abstract
Several advanced characterization methods used for defect passivation were reviewed, including capacitance measurements, spectrometry and microscopy characterizations, as well as some newly applied in situ techniques.
Topics & Concepts
PassivationCharacterization (materials science)Materials sciencePerovskite (structure)CapacitanceOptoelectronicsNanotechnologyChemical engineeringChemistryElectrodeEngineeringPhysical chemistryLayer (electronics)Perovskite Materials and ApplicationsChalcogenide Semiconductor Thin FilmsConducting polymers and applications