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The effect of non-ionic surfactants on the removal of cerium oxide particles in STI CMP post cleaning

Xinyu Zhao, Mei Yan, Fangyuan Wang, Xinyu Han, Baimei Tan, Jiadong Zhao, Renhao Liu, Yunhui Shi

2024Materials Science in Semiconductor Processing12 citationsDOI

Topics & Concepts

Materials scienceEthylenediaminetetraacetic acidWettingChemical engineeringChemical-mechanical planarizationScanning electron microscopeSurface tensionParticle (ecology)WaferOxideCleaning agentIonic bondingSurface modificationNanotechnologyPolishingComposite materialIonChemistryChelationMetallurgyOrganic chemistryOceanographyQuantum mechanicsGeologyEngineeringPhysicsAdvanced Surface Polishing TechniquesMinerals Flotation and Separation TechniquesElectronic and Structural Properties of Oxides
The effect of non-ionic surfactants on the removal of cerium oxide particles in STI CMP post cleaning | Litcius