Boundary characterization using 3D mapping of geometrically necessary dislocations in AM Ta microstructure
Wyatt A. Witzen, Andrew Polonsky, Paul F. Rottmann, Kira M. Pusch, McLean P. Echlin, Tresa M. Pollock, Irene J. Beyerlein
Topics & Concepts
MicrostructureMaterials scienceElectron backscatter diffractionDislocationGrain boundaryCrystallographyTantalumCharacterization (materials science)PorosityDiffractionComposite materialCondensed matter physicsGeometryOpticsMetallurgyNanotechnologyPhysicsChemistryMathematicsAdditive Manufacturing Materials and ProcessesMicrostructure and mechanical propertiesHigh Entropy Alloys Studies