Degradation data analysis based on gamma process with random effects
Xiaofei Wang, Bing Xing Wang, Yili Hong, Peihua Jiang
Topics & Concepts
QuantileGamma processConfidence intervalReliability (semiconductor)StatisticsInferenceMathematicsApplied mathematicsWald testMonte Carlo methodDegradation (telecommunications)Random effects modelComputer scienceAlgorithmStatistical hypothesis testingArtificial intelligenceMeta-analysisPhysicsQuantum mechanicsMedicineTelecommunicationsInternal medicinePower (physics)Reliability and Maintenance OptimizationStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering Design