Degradation modeling and reliability assessment for a multi-component system with structural dependence
Duc-Hanh Dinh, Phuc Do, Benoît Iung
Topics & Concepts
Degradation (telecommunications)Component (thermodynamics)Reliability engineeringReliability (semiconductor)Structural reliabilityComputer scienceEngineeringArtificial intelligenceThermodynamicsPhysicsElectronic engineeringPower (physics)Probabilistic logicReliability and Maintenance OptimizationRisk and Safety AnalysisProbabilistic and Robust Engineering Design