Modeling of shallow extension engineered dual metal surrounding gate (SEE-DM-SG) MOSFET gate-induced drain leakage (GIDL)
Anubha Goel, Sonam Rewari, Seema Verma, R.S. Gupta
Topics & Concepts
Leakage (economics)MOSFETMaterials scienceQuantum tunnellingDrain-induced barrier loweringMetal gateSuperposition principleOptoelectronicsThreshold voltageElectric fieldVoltageElectrical engineeringGate oxidePhysicsTransistorEngineeringMacroeconomicsEconomicsQuantum mechanicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignElectrostatic Discharge in Electronics