Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films
André Wählisch, Cornelia Streeck, Philipp Hönicke, Burkhard Beckhoff
Abstract
Reference-free X-ray fluorescence analysis of multilayered, alloyed thin films in the μm regime with significant secondary fluorescence contributions.
Topics & Concepts
FluorescenceMaterials scienceExcitationAnalytical Chemistry (journal)Thin filmX-ray fluorescenceAlloyLaser-induced fluorescenceFluorescence spectrometryResonance fluorescenceQuantitative analysis (chemistry)Fluorescence spectroscopyChemistryFluorescence cross-correlation spectroscopyX-ray Spectroscopy and Fluorescence AnalysisAdvanced X-ray Imaging TechniquesDigital Radiography and Breast Imaging