Litcius/Paper detail

Life-cycle modeling driven by coupling competition degradation for remaining useful life prediction

Yasong Li, Zheng Zhou, Chuang Sun, Jun Peng, Asoke K. Nandi, Ruqiang Yan

2023Reliability Engineering & System Safety34 citationsDOI

Topics & Concepts

Degradation (telecommunications)Artificial intelligenceProcess (computing)Coupling (piping)Markov modelComputer scienceMarkov chainMachine learningBiological systemEngineeringMechanical engineeringOperating systemBiologyTelecommunicationsMachine Fault Diagnosis TechniquesFault Detection and Control SystemsReliability and Maintenance Optimization
Life-cycle modeling driven by coupling competition degradation for remaining useful life prediction | Litcius