Temperature and thickness dependent dielectric functions of MoTe2 thin films investigated by spectroscopic ellipsometry
Mingsheng Fang, Honggang Gu, Zhengfeng Guo, Jiamin Liu, Liusheng Huang, Shiyuan Liu
Topics & Concepts
EllipsometryDielectricCondensed matter physicsMaterials scienceScalingThin filmSurface roughnessAttenuationOpticsNanotechnologyPhysicsOptoelectronicsGeometryComposite materialMathematics2D Materials and ApplicationsGraphene research and applicationsPerovskite Materials and Applications