Frequency-resolved characterization of broadband two-color air-plasma terahertz beam profiles
Mattias Rasmussen, Oliver Nagy, Stefan Skupin, Alexandre Stathopulos, Luc Bergé, Peter Uhd Jepsen, Binbin Zhou
Abstract
The frequency-resolved terahertz (THz) beam profile characteristics of a two-color air-plasma THz source were investigated in the broadband frequency range (1-15 THz). The frequency resolution is achieved by combining THz waveform measurements and the knife-edge technique. Our results show that the THz focal spot size is strongly frequency dependent. This has important implications on nonlinear THz spectroscopy applications where accurate knowledge of the applied THz electrical field strength onto the sample is important. In addition, the transition between the solid and hollow beam profile of the air-plasma THz beam was carefully identified. Far from the focus, the features across the 1-15 THz range have also been carefully examined, revealing the characteristic conical emission patterns at all frequencies.