Recent advances in structured illumination microscopy
Ying Ma, Kai Wen, Min Liu, Juanjuan Zheng, Kaiqin Chu, Zachary J. Smith, Lixin Liu, Peng Gao
Abstract
Abstract Structured illumination microscopy (SIM), is a wide-field, minimally-invasive super-resolution optical imaging approach with optical sectioning capability, and it has been extensively applied to many different fields. During the past decades, SIM has been drawing great attention for both the technique development and applications. In this review, firstly, the basic conception, instrumentation, and functionalities of SIM are introduced concisely. Secondly, recent advances in SIM which enhance SIM in different aspects are reviewed. Finally, the variants of SIM are summarized and the outlooks and perspectives of SIM are presented.
Topics & Concepts
Instrumentation (computer programming)Computer scienceField (mathematics)MicroscopyResolution (logic)NanotechnologyOpticsArtificial intelligenceMaterials sciencePhysicsMathematicsPure mathematicsOperating systemAdvanced Fluorescence Microscopy TechniquesNear-Field Optical MicroscopyAdvanced Electron Microscopy Techniques and Applications