A systemic comparison between using augmented data and synthetic data as means of enhancing wafermap defect classification
Rajaa Alqudah, Amjed Al‐Mousa, Yazan Abu Hashyeh, Omar Z. Alzaibaq
Topics & Concepts
Support vector machineComputer scienceArtificial intelligenceRandom forestMachine learningSynthetic dataData miningTest dataArtificial neural networkF1 scoreClassifier (UML)RegressionPattern recognition (psychology)StatisticsMathematicsProgramming languageIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure Analysis