Atomic-Scale Investigation of Electromigration with Different Directions of Electron Flow into High-Density Nanotwinned Copper through In Situ HRTEM
Fang‐Chun Shen, Chih‐Yang Huang, Hung-Yang Lo, Wei-You Hsu, Chien-Hua Wang, Chih Chen, Wen‐Wei Wu
Topics & Concepts
ElectromigrationHigh-resolution transmission electron microscopyMaterials sciencePerpendicularElectronTransmission electron microscopyAtomic unitsMicrostructureCondensed matter physicsNanotechnologyComposite materialPhysicsGeometryQuantum mechanicsMathematicsCopper Interconnects and ReliabilityElectronic Packaging and Soldering TechnologiesMetal and Thin Film Mechanics